Opto Alignment | Advanced Lens Alignment and Optical Metrology Solutions | Made in the USA
LAS-IAM™
Image Analysis Measurement
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System Characteristics
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Designed for in-situ transmission measurements of on-axis MTF, EFL, BFL, FFL and ROC (with Vertex Measurement option)
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Combining the merits of patented LAS™ imaging and advanced reticle projection technologies, the Image Analysis Module (IAM) offers unparalleled measurement accuracy with great efficiency
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Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software
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Measurement range scales with the height of the LAS vertical stage
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Both sagittal and tangential MTF can be measured and reported
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Triple-cross negative reticle permits simultaneous calculation of EFL and tan/sag MTF
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Through focus analysis for sharpest image
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Automatic line detection and region of interest placement
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Graphs Line Spread Function and tan/sag MTF
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Fully automated for fast analysis
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