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LAS-XUPâ„¢

LAS-XUP™

An Extra-Large, Ultra-Precision Centering Solution for the

Alignment & Inspection of Extra-Large Lens Assemblies

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The LAS-XUP™ is our largest (Extra-Large, Ultra-Precision), non-contact lens alignment and inspection system designed for optimizing lens centration and tilt in your largest multi-element lens assemblies. OATi's core measurement technology is based on focused laser reflection, with sources that are available over a broad range of wavelengths from visible (VIS) to Long-Wave IR (LWIR).  Our CalcuLens™ software permits fast switching between wavelengths and power optimization, resulting in superior imaging with sub-micron measurement precision.

SYSTEM CAPABILITIES

  • Assembly diameters: < 1000 mm

  • Assembly depths: < 2000 mm

  • Sample weight: < 1300 kg

  • Centration Accuracy: 0.2-0.5 micron

  • Tilt Accuracy: 0.5-1.0 arcsec

  • Runout Precision: < 50 nm

SIZE/WEIGHT/POWER/REQUIREMENTS​

  • System Dimensions: 1600 x 1500 x 3600 mm

  • System Weight: 1750 kg

  • Bearing Diameter: 600 mm

  • Workbench Diameter: 800 mm / 1000 mm

  • Vertical Stage Travel: 2000 - 3000 mm

  • Power Requirements: 110-220V AC, 50-60 Hz, 1-phase, 2-amps (220V)/4-amps (110V)

  • Compressed Air Requirements: 60 PSI (4 bars), 4 CFM flow, 

OTHER ADD-ONS

  • Contact TIR Probe with software interface to CalcuLens™

  • Non-contact TIR Probe with software interface to CalcuLens™

  • Objectives: nominal working distance of 40 mm, 90 mm (standard), and 150 mm; broad-band versions also available with extended transmission from 400 nm to 12000 nm; extra-long working distances available up to 730 mm

  • Integrated Stand: unmoveable platform with passive vibration isolation

  • Glue dispensing and UV curing stations

  • VRM: Vertex/ROC Module for controlling surface airgaps within 2.5 microns

  • RAM: Reticle Alignment Module to align reticles, apertures, and detectors

APPLICATIONS

  • Cementing of doublets & triplets

  • Centering & bonding of multi-lens assemblies

  • Alignment & Inspection of multi-lens assemblies

  • Measurement of lens vertex height and airgaps

  • Measurement of lens Radius of Curvature

  • Measurement of lens/assembly beam deviation

  • TIR profiling of rotationally symmetric housings and cells

WAVELENGTH OPTIONS

  • LAS-XUP™ can accommodate up to 4 different spectral bands with up to 5 wavelengths​​

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  • VIS: 460 nm, 520 nm, or 660 nm

  • NIR: 840 nm or 930 nm

  • SWIR: 1060 nm, 1300 nm, or 1550 nm

  • MWIR: 4050 nm

  • LWIR: 9500 nm

OTHER ADD-ONS

  • SPM: Surface Profiling Module for 3D optical surface profiling

  • IAM Image Analysis Module for on-axis MTF, EFL, BFL, FFL measurement

  • ATM: Aspheric Tilt Module to measure & optimize tilt of aspheric lenses

  • DMI-200/600: Distance Measuring Interferometer for center thickness and airgap measurement of tall lens assemblies (either 200 mm or 600-mm assembly depths)

  • LensHandler™ kit for lens edge painting, lens cleaning and inspection

  • ROTOwand™ for vacuum lens pick-up & handling

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