IAM-BT™

Image Analysis Measurement

Offers Unparalleled Measurement Accuracy of On-Axis MTF, EFL, BFL, FFL, Wedge, Beam Deviation, CT and ROC

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Image Analysis Measurement Bench Top (IAM-BT™) offers transmission measurement of on-axis MTF, EFL, BFL, wedge, beam deviation and reflection measurement of FFL, CT and ROC with market leading accuracy in a user friendly package.

 

Intuitive IAM software user-interface provides customers with seamless operation. Fully integrated with the universal Calculens™ software.

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System Characteristics

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• Both sagittal and tangential MTF can be measured and reported

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• Precision circular aperture reticle permits simultaneous calculation of EFL and tan/sag MTF

 

• Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software

 

• Measurement range scales with the height of the LAS vertical stage

 

• Both sagittal and tangential MTF can be measured and reported

 

• Precision circular reticle permits simultaneous calculation of EFL and tan/sag MTF

 

• Through focus analysis for sharpest image

 

• Automatic line detection and region of interest placement

 

• Graphs Line Spread Function and tan/sag MTF

 

• Fully automated for fast analysis

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