v=spf1 include:zcsend.net ~all IAM-BT Standalone Image Analysis Measurement

IAM-BT™

Image Analysis Measurement

Offers Unparalleled Measurement Accuracy of On-Axis MTF, EFL, BFL, FFL, Wedge, Beam Deviation, CT and ROC

Image Analysis Measurement Bench Top (IAM-BT) offers transmission measurement of on-axis MTF, EFL, BFL, wedge, beam deviation and reflection measurement of FFL, CT and ROC with market leading accuracy in a user friendly package.

 

Intuitive IAM software user-interface provides customers with seamless operation. Fully integrated with the universal Calculens software.

System Characteristics

  • Both sagittal and tangential MTF can be measured and reported

  • Precision circular aperture reticle permits simultaneous calculation of EFL and tan/sag MTF

 

  • Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software

 

  • Measurement range scales with the height of the LAS vertical stage

 

  • Both sagittal and tangential MTF can be measured and reported

 

  • Precision circular reticle permits simultaneous calculation of EFL and tan/sag MTF

 

  • Through focus analysis for sharpest image

 

  • Automatic line detection and region of interest placement

 

  • Graphs Line Spread Function and tan/sag MTF

 

  • Fully automated for fast analysis

                                           

Tel: (704) 893 - 0399

Hours: 9am - 7pm

Built With Pride In The USA

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