QuickPRO-CUBE™ Mini

High-speed, dual-surface, geometry characterization

of single or in-tray optical components

​

Video of QuickPRO-Cube in action

​

By integrating a pair of single-point, non-contact, nanometer-resolution chromatic confocal sensors with high-speed, nanometer-encoded X/Y/Z coordinated motion, the QuickPRO-CUBE™ captures simultaneous front, back and datum surface 3D point cloud topography for the geometric characterization of single lenses or micro lenses in trays. The form invariant motion architecture permits measurement of both rotationally symmetric and more complex non-axially symmetric or freeform shapes to a maximum measurement diameter of 50mm (up to 75mm OD). The total measurement time is from 30sec to 240sec per surface per lens, depending on the lens diameter and 3D point cloud sampling density. 

 

Measured geometric parameters include:

• Front-to-Back surface Vertex Offset relative to defined centration datum

• Front-to-Back surface Wedge Angle relative to defined tilt datum

• Front-to-Back Total Thickness variation (TTV) and Center Thickness (CT)

• Front and Back surface Sag/Form error

​

SYSTEM CHARACTERISTICS

• Compact, bench-top unit with environmental enclosure

• Dual single-point, non-contact, visible-light, chromatic confocal sensors with 8kHz combined measuring rate

• Vibration insensitive and dimensionally stable Invar metrology frame 

• Nanometer encoded X/Y/Z coordinated motion with magnetic linear motors and cross roller bearings for fast raster or spiral scanning over 50mm (X), 50mm (Y), 50mm (Z)

• Self-centering fixture with precision quick connect for fast load/unload

• Fixtures for both single optical components (up to 75mm OD) and micro-lens trays 

• User-friendly QuickPRO™ instrument control and data acquisition software for sensor optimization, auto-centering, data capture and coordinated motion sequencing

• CalcuSurf-3D™ view and analyze software for multi-surface 3D point cloud data

 

APPLICATIONS​

The CUBE is specifically designed for factory-floor QA of polished, molded, or diamond turned optical components, including optically opaque infrared materials and metals. An added advantage is the ability to measure multiple smaller lenses in-tray or lens arrays during a single measurement sequence.