v=spf1 include:zcsend.net ~all LAS-IAM Image Analysis Measurement
top of page
LAS-IAM™

LAS-IAM™

Image Analysis Measurement

System Characteristics

  • Designed for in-situ transmission measurements of on-axis MTF, EFL, BFL, FFL and ROC (with Vertex Measurement option)

 

  • Combining the merits of patented LAS™ imaging and advanced reticle projection technologies, the Image Analysis Module (IAM) offers unparalleled measurement accuracy with great efficiency

 

  • Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software

 

  • Measurement range scales with the height of the LAS vertical stage

 

  • Both sagittal and tangential MTF can be measured and reported

 

  • Triple-cross negative reticle permits simultaneous calculation of EFL and tan/sag MTF

 

  • Through focus analysis for sharpest image

 

  • Automatic line detection and region of interest placement

 

  • Graphs Line Spread Function and tan/sag MTF

 

  • Fully automated for fast analysis

Screen Shot 2020-06-22 at 11.34.18 AM.pn
bottom of page