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Image Analysis Measurement

System Characteristics

  • Designed for in-situ transmission measurements of on-axis MTF, EFL, BFL, FFL and ROC (with Vertex Measurement option)


  • Combining the merits of patented LAS™ imaging and advanced reticle projection technologies, the Image Analysis Module (IAM) offers unparalleled measurement accuracy with great efficiency


  • Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software


  • Measurement range scales with the height of the LAS vertical stage


  • Both sagittal and tangential MTF can be measured and reported


  • Triple-cross negative reticle permits simultaneous calculation of EFL and tan/sag MTF


  • Through focus analysis for sharpest image


  • Automatic line detection and region of interest placement


  • Graphs Line Spread Function and tan/sag MTF


  • Fully automated for fast analysis

Tel: (704) 893 - 0399

Hours: 9am - 7pm

Built With Pride In The USA

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© Opto-Alignment Technology, Inc.

LAS-IAM Upward Angle