v=spf1 include:zcsend.net ~all LAS-IAM Image Analysis Measurement

LAS-IAM™

Image Analysis Measurement

System Characteristics

  • Designed for in-situ transmission measurements of on-axis MTF, EFL, BFL, FFL and ROC (with Vertex Measurement option)

 

  • Combining the merits of patented LAS™ imaging and advanced reticle projection technologies, the Image Analysis Module (IAM) offers unparalleled measurement accuracy with great efficiency

 

  • Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software

 

  • Measurement range scales with the height of the LAS vertical stage

 

  • Both sagittal and tangential MTF can be measured and reported

 

  • Triple-cross negative reticle permits simultaneous calculation of EFL and tan/sag MTF

 

  • Through focus analysis for sharpest image

 

  • Automatic line detection and region of interest placement

 

  • Graphs Line Spread Function and tan/sag MTF

 

  • Fully automated for fast analysis

                                              SPECIFICATIONS

Tel: (704) 893 - 0399

Hours: 9am - 7pm

Built With Pride In The USA

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LAS-IAM Product Solo