Opto Alignment | Advanced Lens Alignment and Optical Metrology Solutions | Made in the USA





IAM-BT™
Image Analysis Measurement
Offers Unparalleled Measurement Accuracy of On-Axis MTF, EFL, BFL, FFL, Wedge, Beam Deviation, CT and ROC
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Image Analysis Measurement Bench Top (IAM-BT™) offers transmission measurement of on-axis MTF, EFL, BFL, wedge, beam deviation and reflection measurement of FFL, CT and ROC with market leading accuracy in a user friendly package.
Intuitive IAM software user-interface provides customers with seamless operation. Fully integrated with the universal Calculens™ software.
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System Characteristics
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Both sagittal and tangential MTF can be measured and reported
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Precision circular aperture reticle permits simultaneous calculation of EFL and tan/sag MTF
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Intuitive IAM software user-interface (UI) provides customers with seamless operation. Fully integrated with the universal LAS Calculens™ software
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Measurement range scales with the height of the LAS vertical stage
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Both sagittal and tangential MTF can be measured and reported
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Precision circular reticle permits simultaneous calculation of EFL and tan/sag MTF
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Through focus analysis for sharpest image
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Automatic line detection and region of interest placement
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Graphs Line Spread Function and tan/sag MTF
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Fully automated for fast analysis
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